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Date de publicationTitreAuteur(s)
2017Experimental investigation of NBTI degradation in power VDMOS transistors under low magnetic fieldTahi, Hakim; Tahanout, Cherifa; Boubaaya, Mohamed; Djezzar, Boualem; Merah, Sidi Mohammed; Nadji, Bacharia; Saoula, Nadia
2015Low magnetic field Impact on NBTI degradationMerah, Sidi Mohammed; Nadji, B.; Tahi, H.
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