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Depot Institutionnel de l'UMBB >
Browsing by Author Boubaaya, Mohamed
Showing results 1 to 7 of 7
| Date de publication | Titre | Auteur(s) | | 2015 | Charge Pumping,GeometricComponent and Degradation ParametersExtraction in MOSFETDevices | Tahi, Hakim; Tahanout, Cherifa; Djezzar, Boualem Djezzar; Boubaaya, Mohamed; Abdelmadjid, Benabdelmoumene; Chenouf, Amel |
| 2017 | Experimental investigation of NBTI degradation in power VDMOS transistors under low magnetic field | Tahi, Hakim; Tahanout, Cherifa; Boubaaya, Mohamed; Djezzar, Boualem; Merah, Sidi Mohammed; Nadji, Bacharia; Saoula, Nadia |
| 2023 | Fast methods for studying the effect of electrical stress on SiO2 dielectrics in Metal-Oxide-Semiconductor Field-Effect transistors | Messaoud, Dhia Elhak; Djezzar, Boualem; Boubaaya, Mohamed; Chenouf, Amel; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene; Zitouni, Abdelkader |
| 2014 | Investigation of NBTI degradation on power VDMOS transistors under magnetic field | Tahi, Hakim; Benmessai, Karim; Le Floch, Jean Michel; Boubaaya, Mohamed; Tahanout, Cherifa; Djezzar, Boualem; BENABDELMOMENE, Abdelmadjid; Goudjil, Mohamed; Chenouf, Amel |
| 2023 | Metal-oxide-semiconductor field-effect transistor (MOSFET) pulsed current-voltage characterization technique: design and discussion | Messaoud, Dhia Elhak; Djezzar, Boualem; Boubaaya, Mohamed; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene; Chenouf, Amel; Zitouni, Abdelkader |
| 2021 | NBTI Fast Electrical Characterization in pMOSFET Devices | Dhia Elhak, Messaoud; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Boubaaya, Mohamed; Zatout, Boumediene; Zitouni, Abdelkader |
| 2023 | Single Pulse Charge Pumping Technique Improvement for Interface-States Profiling in the Channel of MOSFET Devices | Messaoud, Dhia Elhak; Djezzar, Boualem; Boubaaya, Mohamed; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene; Chenouf, Amel; Zitouni, Abdelkader |
Showing results 1 to 7 of 7
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