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Depot Institutionnel de l'UMBB >
Browsing by Author Houadef, Ali
Showing results 1 to 5 of 5
| Date de publication | Titre | Auteur(s) | | 2022 | Detailed total ionizing dose effects on LDMOS transistors | Houadef, Ali; Djezzar, Boualem |
| 2021 | Evaluation of Hot Carrier Impact on Lateral- DMOS with LOCOS feature | Houadef, Ali; Djezzar, Boualem |
| 2020 | HCI degradation of LOCOS-based LDMOS transistor fabricated by 1 μ m CMOS process | Houadef, Ali; Djezzar, Boualem |
| 2021 | Hot carrier degradation in Triple-RESURF LDMOS with Trenched-Gate | Houadef, Ali; Djezzar, B. |
| 2021 | Process and performance optimization of Triple-RESURF LDMOS with Trenched-Gate | Houadef, Ali; Djezzar, Boualem |
Showing results 1 to 5 of 5
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