|
|
Depot Institutionnel de l'UMBB >
Browsing by Author Tahanout, Cherifa
Showing results 1 to 9 of 9
| Date de publication | Titre | Auteur(s) | | 2014 | An accurate combination of on-the-fly interface trap and threshold voltage methods for NBTI degradation extraction | Tahanout, Cherifa; Tahi, Hakim; Djezzar, Boualem; Benabdelmomene, Abdelmadjid; Goudjil, Mohamed; Nadji, Becharia |
| 2015 | Charge Pumping,GeometricComponent and Degradation ParametersExtraction in MOSFETDevices | Tahi, Hakim; Tahanout, Cherifa; Djezzar, Boualem Djezzar; Boubaaya, Mohamed; Abdelmadjid, Benabdelmoumene; Chenouf, Amel |
| 2020 | Contribution à l’étude de la fiabilité des microsystèmes (MEMS) | Tahanout, Cherifa |
| 2010 | Etude, simulation électrothermique d’un micro capteur de gaz à base d’oxyde semi-conducteur | Tahanout, Cherifa |
| 2017 | Experimental Investigation of NBTI Degradation in Power VDMOS Transistors Under Low Magnetic Field | TAHI, Hakim; Tahanout, Cherifa; BOUBAAYA, Mohamed; Djezzar, Boualem; Merah, Sidi Mohammed; Nadji, Bacharia; SAOULA, Nadia |
| 2017 | Experimental investigation of NBTI degradation in power VDMOS transistors under low magnetic field | Tahi, Hakim; Tahanout, Cherifa; Boubaaya, Mohamed; Djezzar, Boualem; Merah, Sidi Mohammed; Nadji, Bacharia; Saoula, Nadia |
| 2014 | Investigation of NBTI degradation on power VDMOS transistors under magnetic field | Tahi, Hakim; Benmessai, Karim; Le Floch, Jean Michel; Boubaaya, Mohamed; Tahanout, Cherifa; Djezzar, Boualem; BENABDELMOMENE, Abdelmadjid; Goudjil, Mohamed; Chenouf, Amel |
| 2012 | Oxide trap annealing by H2 cracking at e'center under NBTI stress | Tahanout, Cherifa; Nadji, Becharia; Tahi, Hakim; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Chenouf, Amel |
| 2019 | Simple and fast simulation approach to investigate the NBTI effect on suspended gate MOS devices | Tahanout, Cherifa; Tahi, Hakim; Bouchera, Nadji; Hocini, Lotfi |
Showing results 1 to 9 of 9
|
