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Browsing by Author Tahi, Hakim

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Date de publicationTitreAuteur(s)
2014An accurate combination of on-the-fly interface trap and threshold voltage methods for NBTI degradation extractionTahanout, Cherifa; Tahi, Hakim; Djezzar, Boualem; Benabdelmomene, Abdelmadjid; Goudjil, Mohamed; Nadji, Becharia
2015Charge Pumping,GeometricComponent and Degradation ParametersExtraction in MOSFETDevicesTahi, Hakim; Tahanout, Cherifa; Djezzar, Boualem Djezzar; Boubaaya, Mohamed; Abdelmadjid, Benabdelmoumene; Chenouf, Amel
2015Deep Analysis of the Geometric Component in Charge Pumping of Polycrystalline Silicon Thin-Film TransistorsTahi, Hakim; Djezzar, Boualem; Tahanout, Cherifa Tahanout; Benmessai, Karim
2012Etude de la fiabilité des dispositifs MOS soumis à des rayonnements ionisantsTahi, Hakim
2017Experimental investigation of NBTI degradation in power VDMOS transistors under low magnetic fieldTahi, Hakim; Tahanout, Cherifa; Boubaaya, Mohamed; Djezzar, Boualem; Merah, Sidi Mohammed; Nadji, Bacharia; Saoula, Nadia
2014Investigation of NBTI degradation on power VDMOS transistors under magnetic fieldTahi, Hakim; Benmessai, Karim; Le Floch, Jean Michel; Boubaaya, Mohamed; Tahanout, Cherifa; Djezzar, Boualem; BENABDELMOMENE, Abdelmadjid; Goudjil, Mohamed; Chenouf, Amel
2008Measurement of Square Resistance In Situ of SnO2: F Thin Film With Annealing at High Temperature Under AirTahi, Hakim; Boumaour, Messaoud; Tala-Ighil, Razika; Belkaid, M. S.
2016On the Circuit-Level Reliability Degradation Due to AC NBTI StressChenouf, Amel; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Tahi, Hakim
2012Oxide trap annealing by H2 cracking at e'center under NBTI stressTahanout, Cherifa; Nadji, Becharia; Tahi, Hakim; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Chenouf, Amel
2019Simple and fast simulation approach to investigate the NBTI effect on suspended gate MOS devicesTahanout, Cherifa; Tahi, Hakim; Bouchera, Nadji; Hocini, Lotfi
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