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| Titre: | Measurement of delay mismatch due to process variations by means of modified ring oscillators |
| Auteur(s): | Zhou, B.
Khouas, Abdelhakim |
| Mots-clés: | Process Variations
Modified Ring Oscillators |
| Date de publication: | 2005 |
| Editeur: | IEEE |
| Collection/Numéro: | Circuits and Systems, 2005;PP.5246-5249 |
| Résumé: | A novel and effective test circuit to measure cell-tocell
delay mismatch due to process variations is presented. A
fully digital control circuit that efficiently realizes the
technique is also described. The proposed test structure is
realized by a series of modified ring oscillators that minimize
factors of inaccuracy. The results of a simulation using 0.18μm
CMOS technology show the feasibility of the technique. This
test structure can be beneficial in thoroughly characterizing
the effects of systematical process variations inside the chip. |
| URI/URL: | http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/3026 |
| ISSN: | 0-7803-8834-8 |
| Collection(s) : | Communications Internationales
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