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Titre: Quantitative analysis of deuterium in a-C:D layers, a Round Robin experiment
Auteur(s): Behrisch, R.
Mayer, M.
Jacob, W.
Assmann, W.
Dollinger, G.
Bergmaier, A.
Kreissig, U.
Friedrich, M.
Sun, G.Y.
Hildebrandt, D.
Akbi, Mohamed
Schneider, W.
Schleubner, D.
Knapp, W.
Edelmann, C.
Mots-clés: Deuterium
Amorphous deuterated carbon (a-C:D)
Plasma
Secondary ion mass spectrometry (SIMS)
Date de publication: 2000
Collection/Numéro: Journal of Nuclear Materials/ Vol.281 (2000);pp. 42-56
Résumé: The absolute amount of deuterium in amorphous deuterated carbon (a-C:D) layers has been measured by six laboratories with di erent techniques, such as MeV ion beam analysis, secondary ion mass spectrometry (SIMS), and thermal desorption spectrometry (TDS). The a-C:D layers have been deposited from a CD 4 glow discharge plasma onto carbon and silicon substrates. The results for the absolute numbers obtained with the di erent analysing techniques show a scatter of up to about 35% around the average value. These deviations are larger than the errors stated by the experimentalists and indicate possible systematic uncertainties in some of the measurements
URI/URL: http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/535
ISSN: 0022-3115
Collection(s) :Publications Internationales

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