DSpace À propos de l'application DSpace
 

Depot Institutionnel de l'UMBB >

Browsing by Author Benabdelmoumene, Abdelmadjid

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:   
Sort by: In order: Results/Page Authors/Record:
Showing results 1 to 9 of 9
Date de publicationTitreAuteur(s)
2020Fast Ids – Vgs technique implementation for NBTI characterizationDhia Elhak, Messaoud; Zitouni, Abdelkader; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene
2023Fast methods for studying the effect of electrical stress on SiO2 dielectrics in Metal-Oxide-Semiconductor Field-Effect transistorsMessaoud, Dhia Elhak; Djezzar, Boualem; Boubaaya, Mohamed; Chenouf, Amel; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene; Zitouni, Abdelkader
2023Metal-oxide-semiconductor field-effect transistor (MOSFET) pulsed current-voltage characterization technique: design and discussionMessaoud, Dhia Elhak; Djezzar, Boualem; Boubaaya, Mohamed; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene; Chenouf, Amel; Zitouni, Abdelkader
2021NBTI Fast Electrical Characterization in pMOSFET DevicesDhia Elhak, Messaoud; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Boubaaya, Mohamed; Zatout, Boumediene; Zitouni, Abdelkader
2016On the Circuit-Level Reliability Degradation Due to AC NBTI StressChenouf, Amel; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Tahi, Hakim
2012Oxide trap annealing by H2 cracking at e'center under NBTI stressTahanout, Cherifa; Nadji, Becharia; Tahi, Hakim; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Chenouf, Amel
2023Single pulse charge pumping technique improvement for interface-states profiling in the channel of MOSFET devicesMessaoud, DhiaElhak; Djezzar, Boualem; Boubaaya, Mohamed; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene; Chenouf, Amel; Zitouni, Abdelkader
2023Single Pulse Charge Pumping Technique Improvement for Interface-States Profiling in the Channel of MOSFET DevicesMessaoud, Dhia Elhak; Djezzar, Boualem; Boubaaya, Mohamed; Benabdelmoumene, Abdelmadjid; Zatout, Boumediene; Chenouf, Amel; Zitouni, Abdelkader
2020Sizing of the CMOS 6T-SRAM cell for NBTI ageing mitigationChenouf, Amel; Djezzar, Boualem; Bentarzi, Hamid; Benabdelmoumene, Abdelmadjid
Showing results 1 to 9 of 9

 

Valid XHTML 1.0! Ce site utilise l'application DSpace, Version 1.4.1 - Commentaires