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Browsing by Author Tahi, H.

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Date de publicationTitreAuteur(s)
2011Fast and simple method for estimation and separation of radiation-induced traps in MOSFETs devicesNadji, B.; Tahi, H.; Djezzar, B.
2011Geometric component in constant-amplitude charge-pumping characteristics of LOCOS- and LDD-MOSFET devicesTahi, H.; Djezzar, B.; Benabdelmoumen, A.; Nadji, B.
2015Low magnetic field Impact on NBTI degradationMerah, S.M.; Nadji, B.; Tahi, H.
2010Modeling and simulation of charge-pumping characteristics for LDD-MOSFET devices with LOCOS isolationTahi, H.; Djezzar, B.; Nadji, B.
2010Radiation effect evaluation in effective short and narrow channels of LDD transistor with LOCOS isolation using OTCP methodTahi, H.; Djezzar, B.; Nadji, B.
2010Using oxide-trap charge-pumping method in radiation-reliability analysis of short lightly doped drain transistorDjezzar, B.; Tahi, H.
2009Why is oxide-trap charge-pumping method appropriate for radiation-induced trap depiction in MOSFET?Djezzar, B.; Tahi, H.; Mokrani, A.
Showing results 1 to 7 of 7

 

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