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Depot Institutionnel de l'UMBB >
Browsing by Author Tobbeche, S.
Showing results 1 to 4 of 4
| Date de publication | Titre | Auteur(s) | | 2005 | Determination of atomic depth profile in ion-beam mixed bilayer systems from the Rutherford backscattering data | Khalfaoui, R.; Tobbeche, S. |
| 2006 | Irradiation-induced gold silicide formation and stoichiometry effects in ion beam-mixed layer | Khalfaoui, R.; Benazzouz, C.; Guittoum, A.; Tabet, N.; Tobbeche, S. |
| 2005 | Mixing of Au in Si induced by secondary and high-order recoil implantation | Khalfaoui, R.; Benazzouz, C.; Guittoum, A.; Tobbeche, S. |
| 2001 | A simple method for the deconvolution of Rutherford backscattering spectra | Khalfaoui, R.; Zilabdi, M.; Behli, S.; Benazzouz, C.; Tobbeche, S. |
Showing results 1 to 4 of 4
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