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Please use this identifier to cite or link to this item: http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/1466

Titre: Charge-extraction technique for studying the surface-states in MOS devices
Auteur(s): Bouderbala, Rachid
Mots-clés: MOS (électronique)
Metal oxide semiconductors
Issue Date: 1992
Description: 198 p. : ill. ; 30 cm
URI: http://dlibrary.univ-boumerdes.dz:8080123456789/1466
Appears in Collections:Magister

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