DSpace À propos de l'application DSpace
 

Depot Institutionnel de l'UMBB >
Publications Scientifiques >
Communications Internationales >

Veuillez utiliser cette adresse pour citer ce document : http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/3020

Titre: Accurate testability analysis based-on multi-frequency test generation and a new testability metric
Auteur(s): Abderrahman, A.
Savaria, Yvon
Khouas, Abdelhakim
Sawan, Mohamad
Mots-clés: Accurate testability analysis based
on multi-frequency test generation
new testability metric
Date de publication: 2008
Editeur: IEEE
Collection/Numéro: Circuits and Systems, 2007. NEWCAS 2007;PP. 1356-1359
Résumé: The effectiveness of testing the analog part of mixed-signal circuits impacts their overall manufacturing cost. Therefore, it is important to have accurate metrics to estimate fault coverage and to precisely measure the test quality. In this paper, we propose an accurate testability analysis based on multi-frequency test pattern generation and a new testability measure called the parameter fault coverage (PFC) that takes into account the continuous characteristic of the parametric faults spectrum and masking effect of process variations. This new analog test metric allows accurately measuring analog test quality and enables taking better decisions regarding the use of design for testability (DFT) techniques. Therefore, poor product test quality and unnecessary design modifications, which may be caused by incorrect fault coverage estimates, can be avoided
URI/URL: http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/3020
ISSN: 1-4244-1164-5
Collection(s) :Communications Internationales

Fichier(s) constituant ce document :

Fichier Description TailleFormat
Accurate testability analysis based-on multi-frequency test generation and a new testability metric.pdf240,97 kBAdobe PDFVoir/Ouvrir
View Statistics

Tous les documents dans DSpace sont protégés par copyright, avec tous droits réservés.

 

Valid XHTML 1.0! Ce site utilise l'application DSpace, Version 1.4.1 - Commentaires