DSpace About DSpace Software

Depot Institutionnel de l'UMBB >
Publications Scientifiques >
Publications Internationales >

Please use this identifier to cite or link to this item: http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/389

Titre: High temperature annealing of sprayed SnO2 : F layers in a silicon solar cell process with screen-printed contacts
Auteur(s): Tala-Ighil, Razika
Boumaour, M.
Belkaid, M.S.
Mallemi, A.
Melhani, K.
Iratni, A.
Mots-clés: Photovoltaics
Tin oxide
Screen printing
Reducing gas
Issue Date: 2006
Collection/Numéro: Solar Energy Materials and Solar Cells/ Vol.90, N°12 (2006);pp.1797–1814
Résumé: In order to improve the solar cell conversion efficiency, a thin film of doped tin oxide (SnO2: F) has been deposited by the spray-pyrolysis technique on a monocrystalline diffused silicon wafer. Subsequently, the layer must undergo the firing step of screen-printed contacts with temperatures up to 830 °C. After annealing, one notices with the naked eye the appearance of speckles disturbing the uniformity of the as-deposited blue-coloured SnO2:F. Characterizations such as XPS, FTIR, RBS, XRD, SEM, Hall Effect, four point probe...etc, are all consistent to reveal a net increase of the SnO2:F layer resistivity which leads to efficiency degradation. Annealing the thin films under CO and 90% N2–10% H2 atmospheres was investigated to seek possibilities to preserve the expected improvements. Unlike forming gas, CO reducing ambient was found to be very effective for the high temperature contact firing with no thin film conductivity deterioration
URI: http://dlibrary.univ-boumerdes.dz:8080/jspui/handle/123456789/389
Appears in Collections:Publications Internationales

Files in This Item:

File Description SizeFormat
High temperature annealing of sprayed SnO2 F layers in a silicon solar cell process with screen-printed contacts.pdf95,22 kBAdobe PDFView/Open
View Statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback