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Titre: | Investigation of single cell delay and delay mismatch in ring oscillator based test structure |
Auteur(s): | Zhou, Bo Amiri, Amir Mohammad Khouas, Abdelhakim |
Mots-clés: | Delay Measurement Delay Mismatch Ring Oscillator Process Variations Intra-Die Fluctuations Inter-Die Fluctuations |
Date de publication: | 2006 |
Collection/Numéro: | Proceedings of the 10th WSEAS International Conference on CIRCUITS, Vouliagmeni, Athens, Greece, July 10-12, 2006;pp. 185-190 |
Résumé: | In previous work, we presented a test structure based on ring oscillator (RO) to measure single cell
delay and delay mismatch, which can provide reliable information on intra-die and inter-die parameter
variations. A delay cell of the configurable RO in the test structure considered for the computation technique
consists of an inverter and a conducting transmission gate between adjacent cells. This paper will analyze the
effects on delay cells of the transmission gates connecting to the output of inverters included in the active RO
and investigate in depth delay mismatch in this RO based test structure. Monte Carlo simulation results reveal
that the computation technique is applicable to derive delay mismatch between delay cells. A large number of
post-layout simulations for different layout structures with different number of cells and different transistor sizes
have been performed to analyze delay mismatch related to interconnect and device parameter variations |
URI/URL: | http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/4529 |
Collection(s) : | Publications Internationales
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