|
Depot Institutionnel de l'UMBB >
Publications Scientifiques >
Publications Internationales >
Veuillez utiliser cette adresse pour citer ce document :
http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/6451
|
| Titre: | Characterization of Thin Layer SnO 2 /Glass by Neutrons Reflectometry |
| Auteur(s): | Khelladi, Mohamed Fadel
Izerrouken, M.
Kermadi, Salim
Tala-Ighil, Razika |
| Mots-clés: | Neutron Reflectivity
Sol-Gel (SG)
Thin Film
TiN Dioxide |
| Date de publication: | 2009 |
| Editeur: | Scientific.net |
| Collection/Numéro: | Materials Science Forum (Volume 609); |
| Résumé: | The thermal annealing behavior of the SnO2 thin films elaborated by sol-gel method has been studied by the neutrons reflectivity technique. From the fit of the experimental data using Parratt32 software program developed at HMI, Berlin, scattering length density, thickness and roughness are extracted. The obtained results show that the film thickness increases with the increasing annealing temperature, and the roughness is higher at 500 °C. Whereas, approximately, the same scattering length density is obtained after each annealing temperature |
| URI/URL: | https://www.scientific.net/MSF.609.155
http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/6451 |
| ISSN: | 1662-9752 |
| Collection(s) : | Publications Internationales
|
Fichier(s) constituant ce document :
Il n'y a pas de fichiers associés à ce document.
|
Tous les documents dans DSpace sont protégés par copyright, avec tous droits réservés.
|
